Probes and Accessories for STM Imaging

Scanning tunneling microscopy (STM) tips can be prepared using several different methods. A new STM tip must be prepared when first setting up for STM and also whenever the tip being used becomes damaged or oxidized. STM imaging of a surface with high aspect ratio features (sharp or steep) requires etched tips, which have a much higher aspect ratio than tips made using wire cutters. For STM imaging of an atomically flat surface—for example, the surface of graphite—blunt cut wire tips may be more stable over time than etched tips and result in better STM images. However, blunt tips can cause multiple tip imaging effects. In particular, blunt cut wire tips can result in a tunneling current between the side of the tip and the side of a surface feature, causing tip imaging effects in the STM image.

Additional information:

• Using Wire Cutters to Make STM Tips
• Etching Tungsten Tips
• Using the Dimension STM Cartridge

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